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dc.contributor.authorȚigau, N.
dc.contributor.authorVladu Radu, D. C.
dc.contributor.authorProdan, G.
dc.contributor.authorGheorghieș, C.
dc.contributor.authorCondurache-Bota, S.
dc.date.accessioned2018-08-28T09:59:45Z
dc.date.available2018-08-28T09:59:45Z
dc.date.issued2013
dc.identifier.issn1453 – 083X
dc.identifier.urihttp://10.11.10.50/xmlui/handle/123456789/5339
dc.descriptionThe Annals of "Dunarea de Jos" University of Galati Fascicle IX Metallurgy and Materials Science N0. 2 – 2013, ISSN 1453 – 083Xro_RO
dc.description.abstractTin oxide (SnO) thin films were prepared onto glass substrates by thermal evaporation under vacuum. The substrate temperature was kept constant at 300 K during the film growth. The structural studies using transmission electron microscopy (TEM) analysis showed that the SnO thin films have a polycrystalline and tetragonal crystal structure with preferential orientation of (110) planes parallel to the substrate. Optical transmission and reflection spectra, at normal incidence, in the spectral range 300-1100 nm, are investigated. The optical properties of SnO thin films were determined. The optical energy band gap, Eg, has been estimated from the absorption coefficient values using Tauc’s procedure. It is found that the SnO thin films exhibit direct band gap.ro_RO
dc.language.isoenro_RO
dc.publisherUniversitatea "Dunărea de Jos" din Galațiro_RO
dc.subjectthermal evaporationro_RO
dc.subjecttin oxidero_RO
dc.subjectoptical propertiesro_RO
dc.titlePreparation and Characterization of Tin Oxide thin Filmsro_RO
dc.typeArticlero_RO


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