Preparation and Characterization of Tin Oxide thin Films
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Date
2013Author
Țigau, N.
Vladu Radu, D. C.
Prodan, G.
Gheorghieș, C.
Condurache-Bota, S.
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Tin oxide (SnO) thin films were prepared onto glass substrates by thermal
evaporation under vacuum. The substrate temperature was kept constant at 300 K
during the film growth. The structural studies using transmission electron
microscopy (TEM) analysis showed that the SnO thin films have a polycrystalline
and tetragonal crystal structure with preferential orientation of (110) planes
parallel to the substrate. Optical transmission and reflection spectra, at normal
incidence, in the spectral range 300-1100 nm, are investigated. The optical
properties of SnO thin films were determined. The optical energy band gap, Eg, has
been estimated from the absorption coefficient values using Tauc’s procedure. It is
found that the SnO thin films exhibit direct band gap.
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- 2013 fascicula9 nr2 [14]